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Direct fabrication of surface relief gratings in chalcogenide glasses by excimer laser interference lithography

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F09%3A00008255" target="_blank" >RIV/00216275:25310/09:00008255 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216275:25310/09:00008347

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Direct fabrication of surface relief gratings in chalcogenide glasses by excimer laser interference lithography

  • Original language description

    In this paper we study the possibility to realise surface relief gratings in thin chalcogenide glass films by holographic exposure using a pulsed KrF excimer laser. Gratings with a period of 540 nm and depths of 100 ? 300 nm were patterned at the surfaceof 1 lm thick films. Due to coupling of an incident near-infrared laser beam to waveguide modes a resonance-like polarisation dependent decline of transmission was observed at specific incidence angles. Just one laser pulse with a fluence of 12 mJ/cm2 per beam was sufficient to achieve the required grating parameters in sulphide glasses with low Tg.

  • Czech name

    Přímá tvorba povrchových reliéfních mřížek v chalkogenidových sklech excimerovou laserovou interferenční litografií

  • Czech description

    Byla studována možnost tvorby povrchových reliéfních mřížek ve vrstvách chalkogenidových skel holografickou expozicí pulzním KrF excimerovým laserem. Byly připraveny mřížky s periodou 540 nm a hloubkou korugace 100 - 300 nm ve vrstvách o tloušťce 1 mikron. K zápisu mřížek do sulfidických skel s nízkou hodnotou Tg postačila i expozice 1 pulzem 12 mJ/cm2.

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    CA - Inorganic chemistry

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2009

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Materials Science: Materials in Electronics

  • ISSN

    0957-4522

  • e-ISSN

  • Volume of the periodical

    20

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    4

  • Pages from-to

  • UT code for WoS article

  • EID of the result in the Scopus database