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The dynamics of photoinduced defect creation in amorphous chalcogenides: The origin of the stretched exponential function

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F14%3A39898657" target="_blank" >RIV/00216275:25310/14:39898657 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1063/1.4861143" target="_blank" >http://dx.doi.org/10.1063/1.4861143</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1063/1.4861143" target="_blank" >10.1063/1.4861143</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    The dynamics of photoinduced defect creation in amorphous chalcogenides: The origin of the stretched exponential function

  • Original language description

    The article discusses the dynamics of photoinduced defect creations (PDC) in amorphous chalcogenides, which is described by the stretched exponential function (SEF), while the well known photodarkening (PD) and photoinduced volume expansion (PVE) are governed only by the exponential function. It is shown that the exponential distribution of the thermal activation barrier produces the SEF in PDC, suggesting that thermal energy, as well as photon energy, is incorporated in PDC mechanisms. The differencesin dynamics among three major photoinduced effects (PD, PVE, and PDC) in amorphous chalcogenides are now well understood.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    CA - Inorganic chemistry

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/EE2.3.20.0254" target="_blank" >EE2.3.20.0254: Research Team for Advanced Non-crystalline Materials</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Applied Physics

  • ISSN

    0021-8979

  • e-ISSN

  • Volume of the periodical

    115

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    4

  • Pages from-to

    "013704-1"-"013704-4"

  • UT code for WoS article

    000329456300030

  • EID of the result in the Scopus database