Amorphous Ge-Bi-Se Thin Films: A Mass Spectrometric Study

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F19%3A39915094" target="_blank" >RIV/00216275:25310/19:39915094 - isvavai.cz</a>
Alternative codes found
RIV/00216224:14310/19:00108152
Result on the web
<a href="https://www.nature.com/articles/s41598-019-55773-9" target="_blank" >https://www.nature.com/articles/s41598-019-55773-9</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1038/s41598-019-55773-9" target="_blank" >10.1038/s41598-019-55773-9</a>

Result language
angličtina
Original language name
Amorphous Ge-Bi-Se Thin Films: A Mass Spectrometric Study
Original language description
The Ge-Bi-Se thin films of varied compositions (Ge content 0-32.1 at. %, Bi content 0-45.7 at. %, Se content 54.3-67.9 at. %) have been prepared by rf magnetron (co)-sputtering technique. The present study was undertaken in order to investigate the clusters generated during the interaction of laser pulses with Ge-Bi-Se thin films using laser ablation time-of-flight mass spectrometry. The stoichiometry of the clusters was determined in order to understand the individual species present in the plasma plume. Laser ablation of Ge-Bi-Se thin films accompanied by ionization produces about 20 positively and/or negatively charged unary, binary and ternary (Ge-x(+), Bi-y(+), Se-z(+/-), GexSez+/-, BiySez+/- and GexBiySez-) clusters. Furthermore, we performed the laser ablation experiments of Ge:Bi:Se elemental mixtures and the results were compared with laser ablation time-of-flight mass spectrometry analysis of thin films. Moreover, to understand the geometry of the generated clusters, we calculated structures of some selected binary and ternary clusters using DFT. The generated clusters and their calculated possible geometries can give important structural information, as well as help to understand the processes present in the plasma processes exploited for thin films deposition.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20506 - Coating and films

Project
<a href="/en/project/GA18-03823S" target="_blank" >GA18-03823S: Advanced methods of fabrication of chalcogenide thin films and their modifications</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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