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Tailoring of Multisource Deposition Conditions towards Required Chemical Composition of Thin Films

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F22%3A39919361" target="_blank" >RIV/00216275:25310/22:39919361 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.mdpi.com/2079-4991/12/11/1830" target="_blank" >https://www.mdpi.com/2079-4991/12/11/1830</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.3390/nano12111830" target="_blank" >10.3390/nano12111830</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Tailoring of Multisource Deposition Conditions towards Required Chemical Composition of Thin Films

  • Original language description

    The model to tailor the required chemical composition of thin films fabricated via multisource deposition, exploiting basic physicochemical constants of source materials, is developed. The model is experimentally verified for the two-source depositions of chalcogenide thin films from Ga-Sb-Te system (tie-lines GaSb-GaTe and GaSb-Te). The thin films are deposited by radiofrequency magnetron sputtering using GaSb, GaTe, and Te targets. Prepared thin films are characterized by means of energy dispersive X-ray analysis coupled with a scanning electron microscope to determine the chemical composition and by variable angle spectroscopic ellipsometry to establish film thickness. Good agreement between results of calculations and experimentally determined compositions of the co-deposited thin films is achieved for both the above-mentioned tie-lines. Moreover, in spite of all the applied simplifications, the proposed model is robust to be generally used for studies where the influence of thin film composition on their properties is investigated.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20506 - Coating and films

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2022

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Nanomaterials

  • ISSN

    2079-4991

  • e-ISSN

    2079-4991

  • Volume of the periodical

    12

  • Issue of the periodical within the volume

    11

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    13

  • Pages from-to

    1830

  • UT code for WoS article

    000808741500001

  • EID of the result in the Scopus database

    2-s2.0-85130815184