Direct observation of conductive filaments from 3D views in memristive devices based on multilayered SiO2: Formation, Dissolution, and vaporization
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F24%3A39921766" target="_blank" >RIV/00216275:25310/24:39921766 - isvavai.cz</a>
Result on the web
<a href="https://www.sciencedirect.com/science/article/pii/S0169433224002976" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0169433224002976</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.apsusc.2024.159584" target="_blank" >10.1016/j.apsusc.2024.159584</a>
Alternative languages
Result language
angličtina
Original language name
Direct observation of conductive filaments from 3D views in memristive devices based on multilayered SiO2: Formation, Dissolution, and vaporization
Original language description
Memristive devices, also known as memristors or ReRAMs, are promising candidates for accessing next-generation memory. In classic electrochemical metallization (ECM) theory, there are only two states of conductive filaments: formation and dissolution. In our experiment, we found that the metallic filaments also vaporized, leaving observable defects in a series of memristive devices based on a Cu-doped multilayered SiO2 electrolyte layer. Furthermore, the vapour from conductive filaments exfoliated adjacent single layers of multilayered SiO2. The morphologies of the conductive filaments in a memristive device (W/Cu-doped SiO2/Ag) were studied using an SEM (scanning electron microscope) instrument equipped with an FIB (focused ion beam) module. With the gradual removal of the electrolyte layer, cross-sectional images of the conductive filaments were captured from perspective, top and side views. Based on these images, a three-dimensional model of the conductive filaments was proposed. All the findings suggested that the SET and RESET processes were complex and involved the simultaneous formation, dissolution and vaporization of conductive filaments. The vaporization of the conductive filaments permanently changed the surface morphology of the devices. This model, presented at the end of our paper, explains the irregular phenomena that occurred in I-V measurements.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20500 - Materials engineering
Result continuities
Project
<a href="/en/project/EF17_048%2F0007376" target="_blank" >EF17_048/0007376: High sensitive sensors and low density materials based on polymeric nanocomposites - NANOMAT</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Surface Science
ISSN
0169-4332
e-ISSN
1873-5584
Volume of the periodical
655
Issue of the periodical within the volume
May 2024
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
9
Pages from-to
159584
UT code for WoS article
001183884100001
EID of the result in the Scopus database
2-s2.0-85184772842