Noise as a tool for non-destructive testing of signle-crystal silicon solar cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26110%2F01%3APU24206" target="_blank" >RIV/00216305:26110/01:PU24206 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Noise as a tool for non-destructive testing of signle-crystal silicon solar cells
Original language description
Transport and noise characteristics of forward and reverse biased single-crystal silicon solar cellswere measured in order to evaluiate the solar cell technology.
Czech name
Noise as a tool for non-destructive testing of signle-crystal silicon solar cells
Czech description
Noise as a tool for non-destructive testing of signle-crystal silicon solar cells
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F04%2F0142" target="_blank" >GA102/04/0142: Noise spectroscopy for fast non-destructive testing of solar cells quality, reliability and service lifetime</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microelectronic Reliability
ISSN
0026-2692
e-ISSN
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Volume of the periodical
2001
Issue of the periodical within the volume
8
Country of publishing house
BE - BELGIUM
Number of pages
6
Pages from-to
1947-1952
UT code for WoS article
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EID of the result in the Scopus database
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