Noise Reliability Indicators for Films Resistors

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26110%2F07%3APU80680" target="_blank" >RIV/00216305:26110/07:PU80680 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Noise Reliability Indicators for Films Resistors

Original language description

Low frequency noise in thin film resistors is generated in the inter-grain regions and its noise spectral density and the frequency exponent of the 1/f a - like noise are sensitive to the technology of preparation of these samples. It is supposed that the noise spectral density at a frequency 10 Hz and the frequency exponent can be used to characterize the technology standard and its time stability. Ageing process was implemented and noisy samples proved to be less stable than low noise ones.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2007

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Physical and Material Engineering 2007

ISBN

978-80-7204-537-2

ISSN

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e-ISSN

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Number of pages

4

Pages from-to

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Publisher name

CERM

Place of publication

Brno

Event location

Velke Losiny

Event date

Sep 4, 2007

Type of event by nationality

EUR - Evropská akce

UT code for WoS article

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