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Numerical correction of topography artifacts in scanning thermal microscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26110%2F15%3APU117473" target="_blank" >RIV/00216305:26110/15:PU117473 - isvavai.cz</a>

  • Alternative codes found

    RIV/00177016:_____/15:#0001224

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Numerical correction of topography artifacts in scanning thermal microscopy

  • Original language description

    A numerical model based on finite element method has been used for simulation of the measurement process using scanning thermal microscopy. As a result, thermal conductivity of carbon nanotubes has been determined.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JB - Sensors, detecting elements, measurement and regulation

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    CONFERENCE PROCEEDINGS NANOCON 2015

  • ISBN

    978-80-87294-63-5

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    1-6

  • Publisher name

    Neuveden

  • Place of publication

    Neuveden

  • Event location

    Brno

  • Event date

    Oct 14, 2015

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article