AFM - a Tool for a Study of Surfaces, Micro- and Nanostructures.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F01%3APU23090" target="_blank" >RIV/00216305:26210/01:PU23090 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
AFM - a Tool for a Study of Surfaces, Micro- and Nanostructures.
Original language description
Atomic force microscopy (AFM) has become a powerful tool for studies of topography of solids and micro/nanostructures. In the contribution the design principles and applications of an AFM microscope developed at the institute will be presented. Particularly, the results of experiments carried out on thin films, micro- and nanostructures will be discussed. Additionally, nanostructures fabricated by AFM will be shown as well.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Materials Structure & Micromechanics of Fracture (MSMF-3)
ISBN
80-214-1892-3
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
394-399
Publisher name
Vutium
Place of publication
Brno
Event location
Brno
Event date
Jun 27, 2001
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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