Selective growth of Co islands on ion beam induced nucleation centers in a native SiO2 film
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F09%3APU80279" target="_blank" >RIV/00216305:26210/09:PU80279 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Selective growth of Co islands on ion beam induced nucleation centers in a native SiO2 film
Original language description
We present a straightforward method for fabrication of patterns of metallic nanostructures. The focused ion beam lithography (FIB) has been used to locally modify a native SiO2 layer on a silicon substrate. On the modified areas preferential nucleation of cobalt islands is observed. The cobalt islands formed upon deposition at 400 - 430 C combined with an intermediate annealing at 550 C have a uniform size distribution and their size can be controlled by the distance between the nucleation sites and theamount of deposited material. It is proposed that the island formation at patterned sites is due to reduced surface diffusion of Co atoms in the vicinity of FIB modified areas. The intermediate annealing improves the island morphology since the kineticdiffusion limits are lowered and system reconfigures towards its equilibrium state.
Czech name
Selektivní růst kobaltových ostrůvků na nukleačních místech vytvořených pomocí fokusovaného iontového svazku ve vrstvě nativního SiO2
Czech description
Selektivní růst kobaltových ostrůvků na nukleačních místech vytvořených pomocí fokusovaného iontového svazku ve vrstvě nativního SiO2
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Aplied Physics
ISSN
0021-8979
e-ISSN
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Volume of the periodical
105
Issue of the periodical within the volume
8
Country of publishing house
US - UNITED STATES
Number of pages
6
Pages from-to
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UT code for WoS article
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EID of the result in the Scopus database
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