Scattermeter for measurements of solar cells

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F15%3APU115454" target="_blank" >RIV/00216305:26210/15:PU115454 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1117/12.2190779" target="_blank" >http://dx.doi.org/10.1117/12.2190779</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2190779" target="_blank" >10.1117/12.2190779</a>

Result language
angličtina
Original language name
Scattermeter for measurements of solar cells
Original language description
Scattermeter II is the second generation device designed and built at The Institute of Physical Engineering, Faculty of Mechanical Engineering, Brno University of Technology. This device has been designed for measuring the angular distribution of the intensity of electromagnetic radiation scattered from a surface of a solid. In this paper, the basic scheme of Scattermeter II and measuring principles with it are described. The results achieved in electromagnetic radiation scattering from surfaces of selected samples of single crystalline silicon wafers used in solar cells are also presented.
Czech name
—
Czech description
—

Project
<a href="/en/project/TA02010784" target="_blank" >TA02010784: Optimization of thin film systems used in the optics industry</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
ISBN
9781628418170
ISSN
0277-786X
e-ISSN
—
Number of pages
8
Pages from-to
96280-96288
Publisher name
Neuveden
Place of publication
Neuveden
Event location
Jena
Event date
Sep 7, 2015
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000366832100011

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