UTILIZATION OF ELECTRON CHANNELLING CONTRAST IMAGING TO DISPLAY CRYSTAL LATTICE ORIENTATION IN SCANNING ELECTRON MICROSCOPY

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F18%3APU144848" target="_blank" >RIV/00216305:26210/18:PU144848 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
UTILIZATION OF ELECTRON CHANNELLING CONTRAST IMAGING TO DISPLAY CRYSTAL LATTICE ORIENTATION IN SCANNING ELECTRON MICROSCOPY
Original language description
Abstract and oral prezentation on 19th International Microscopy Congress. 9 - 14 September 2018. Recently, the backscattered electron diffraction (EBSD) method, which is closely associated with scanning electron microscopy, has been successfully used to analyze the crystal lattice of polycrystalline materials. The EBSD method is applied to bulk samples and provides, among other things, information on the orientation of crystal lattices of individual grains, texture, deformations, or information on the representation and distribution of individual phases. The big advantage of this method is the speed of acquisition and processing of measured diffraction patterns, this is mainly due to the computing power of current computers, improving the algorithms for indexing the diffraction bands. A new method based on the well-known channelling contrast effect can also be used to map orientation. This method is based on the interaction of primary electrons in the material. The method is based on the modulation of
Czech name
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Czech description
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Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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