Interphase boundary layer-dominated strain mechanisms in Cu+ implanted Zr-Nb nanoscale multilayers
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F21%3APU138602" target="_blank" >RIV/00216305:26210/21:PU138602 - isvavai.cz</a>
Alternative codes found
RIV/68378271:_____/21:00541848 RIV/68407700:21230/21:00345490 RIV/68407700:21340/21:00345490 RIV/61389005:_____/21:00541848 RIV/00216208:11320/21:10437535
Result on the web
<a href="https://doi.org/10.1016/j.actamat.2020.10.072" target="_blank" >https://doi.org/10.1016/j.actamat.2020.10.072</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.actamat.2020.10.072" target="_blank" >10.1016/j.actamat.2020.10.072</a>
Alternative languages
Result language
angličtina
Original language name
Interphase boundary layer-dominated strain mechanisms in Cu+ implanted Zr-Nb nanoscale multilayers
Original language description
Sputter-deposited Zr/Nb nanoscale metallic multilayers with a periodicity of 27 (thin) and 96 nm (thick) were subjected to Cu + implantation with low and high fluences and then studied using various experimental techniques in combination with DFT calculations. After Cu + implantation, the thinner multilayer exhibited a tensile strain along c-axis in Nb layers and a compressive strain in Zr layers, while the thicker multilayer showed a compressive strain in both layers. The strain is higher in the thin multilayer and increases for higher fluences. We developed a mathematical method for the fundamental understanding of the deformation mechanisms in metallic multilayers subjected to radiation damage. In the model, the cumulative strain within a layer is described as the combination of two contributions coming from the interfacial region and the inner region of the layers. The semi-analytical model predicts that the interfacial strain is dominant and extends over a certain region around the interface. Predictions are well supported by ab-initio calculations which show that in the vicinity of the interface and in the Zr side, vacancies and interstitials (low energy barriers) exhibit high mobility compared to the Nb side, thus resulting in a high recombination rate. As a consequence, less strain occurs in the Zr side of the interface compared to the Nb side. The density and distribution of various types of defects along the ion profile (low and high damaged regions) are obtained by combining DFT results and the predictions of the model. (c) 2020 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20501 - Materials engineering
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Acta materialia
ISSN
1359-6454
e-ISSN
1873-2453
Volume of the periodical
202
Issue of the periodical within the volume
1
Country of publishing house
US - UNITED STATES
Number of pages
14
Pages from-to
317-330
UT code for WoS article
000599838400004
EID of the result in the Scopus database
2-s2.0-85096159875