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Interphase boundary layer-dominated strain mechanisms in Cu+ implanted Zr-Nb nanoscale multilayers

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F21%3APU138602" target="_blank" >RIV/00216305:26210/21:PU138602 - isvavai.cz</a>

  • Alternative codes found

    RIV/68378271:_____/21:00541848 RIV/68407700:21230/21:00345490 RIV/68407700:21340/21:00345490 RIV/61389005:_____/21:00541848 RIV/00216208:11320/21:10437535

  • Result on the web

    <a href="https://doi.org/10.1016/j.actamat.2020.10.072" target="_blank" >https://doi.org/10.1016/j.actamat.2020.10.072</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.actamat.2020.10.072" target="_blank" >10.1016/j.actamat.2020.10.072</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Interphase boundary layer-dominated strain mechanisms in Cu+ implanted Zr-Nb nanoscale multilayers

  • Original language description

    Sputter-deposited Zr/Nb nanoscale metallic multilayers with a periodicity of 27 (thin) and 96 nm (thick) were subjected to Cu + implantation with low and high fluences and then studied using various experimental techniques in combination with DFT calculations. After Cu + implantation, the thinner multilayer exhibited a tensile strain along c-axis in Nb layers and a compressive strain in Zr layers, while the thicker multilayer showed a compressive strain in both layers. The strain is higher in the thin multilayer and increases for higher fluences. We developed a mathematical method for the fundamental understanding of the deformation mechanisms in metallic multilayers subjected to radiation damage. In the model, the cumulative strain within a layer is described as the combination of two contributions coming from the interfacial region and the inner region of the layers. The semi-analytical model predicts that the interfacial strain is dominant and extends over a certain region around the interface. Predictions are well supported by ab-initio calculations which show that in the vicinity of the interface and in the Zr side, vacancies and interstitials (low energy barriers) exhibit high mobility compared to the Nb side, thus resulting in a high recombination rate. As a consequence, less strain occurs in the Zr side of the interface compared to the Nb side. The density and distribution of various types of defects along the ion profile (low and high damaged regions) are obtained by combining DFT results and the predictions of the model. (c) 2020 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20501 - Materials engineering

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2021

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Acta materialia

  • ISSN

    1359-6454

  • e-ISSN

    1873-2453

  • Volume of the periodical

    202

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    14

  • Pages from-to

    317-330

  • UT code for WoS article

    000599838400004

  • EID of the result in the Scopus database

    2-s2.0-85096159875