All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Comparison of Sublimation 3D Scanning Sprays in Terms of Their Effect on the Resulting 3D Scan, Thickness, and Sublimation Time

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F23%3APU148987" target="_blank" >RIV/00216305:26210/23:PU148987 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.mdpi.com/1996-1944/16/18/6165" target="_blank" >https://www.mdpi.com/1996-1944/16/18/6165</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.3390/ma16186165" target="_blank" >10.3390/ma16186165</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Comparison of Sublimation 3D Scanning Sprays in Terms of Their Effect on the Resulting 3D Scan, Thickness, and Sublimation Time

  • Original language description

    This study compared eight sublimation scanning sprays in terms of their effect on 3D scanning results, coating thickness, and sublimation time. The work used an automated spraying system to ensure the same deposition conditions for all tested materials. All experiments were performed under the same environmental conditions to exclude the influence of the ambient environment on the coatings. All tested scanning sprays created coatings with thicknesses in the order of tens of micrometers that were detectable by the 3D scanner Atos III Triple Scan. The coatings must be applied carefully when accurate measurements are required. All used materials enabled the capture of the highly reflective surface of the Si-wafer. However, the differences between some sprays were significant. Sublimation time measurements showed that all coatings disappeared from the Si-wafer surface completely. Nevertheless, all coatings left visible traces on the mirror-like surface. They were easily wiped off with a cloth.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20506 - Coating and films

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2023

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Materials

  • ISSN

    1996-1944

  • e-ISSN

  • Volume of the periodical

    16

  • Issue of the periodical within the volume

    18

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    15

  • Pages from-to

    1-15

  • UT code for WoS article

    001080077700001

  • EID of the result in the Scopus database

    2-s2.0-85172725847