Comparison of Sublimation 3D Scanning Sprays in Terms of Their Effect on the Resulting 3D Scan, Thickness, and Sublimation Time
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F23%3APU148987" target="_blank" >RIV/00216305:26210/23:PU148987 - isvavai.cz</a>
Result on the web
<a href="https://www.mdpi.com/1996-1944/16/18/6165" target="_blank" >https://www.mdpi.com/1996-1944/16/18/6165</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.3390/ma16186165" target="_blank" >10.3390/ma16186165</a>
Alternative languages
Result language
angličtina
Original language name
Comparison of Sublimation 3D Scanning Sprays in Terms of Their Effect on the Resulting 3D Scan, Thickness, and Sublimation Time
Original language description
This study compared eight sublimation scanning sprays in terms of their effect on 3D scanning results, coating thickness, and sublimation time. The work used an automated spraying system to ensure the same deposition conditions for all tested materials. All experiments were performed under the same environmental conditions to exclude the influence of the ambient environment on the coatings. All tested scanning sprays created coatings with thicknesses in the order of tens of micrometers that were detectable by the 3D scanner Atos III Triple Scan. The coatings must be applied carefully when accurate measurements are required. All used materials enabled the capture of the highly reflective surface of the Si-wafer. However, the differences between some sprays were significant. Sublimation time measurements showed that all coatings disappeared from the Si-wafer surface completely. Nevertheless, all coatings left visible traces on the mirror-like surface. They were easily wiped off with a cloth.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20506 - Coating and films
Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Materials
ISSN
1996-1944
e-ISSN
—
Volume of the periodical
16
Issue of the periodical within the volume
18
Country of publishing house
CH - SWITZERLAND
Number of pages
15
Pages from-to
1-15
UT code for WoS article
001080077700001
EID of the result in the Scopus database
2-s2.0-85172725847