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Reliability testing and machine learning approach for modelling high-power light-emitting diode reliability

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F26%3A0201476" target="_blank" >RIV/00216305:26210/26:0201476 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1051/matecconf/202541303005" target="_blank" >https://doi.org/10.1051/matecconf/202541303005</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1051/matecconf/202541303005" target="_blank" >10.1051/matecconf/202541303005</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Reliability testing and machine learning approach for modelling high-power light-emitting diode reliability

  • Original language description

    The high-power Light Emitting Diode (LED) is a specialized type of LED that has found extensive use in a wide array of fields, particularly in areas such as lighting, signalling, and medical applications due to their cost-effectiveness and replace-ability. As a result of significant technological advancements, high-power LEDs have undergone rapid development, leading to improvements in quality, variety, and application. Within the realm of reliability research, high-power LEDs have garnered considerable attention. The primary aim of this paper is to conduct a comprehensive exploration and analysis of the existing methodologies for testing the reliability of high-power LEDs. This endeavour will involve a thorough investigation into the types of objects utilized for testing, the diverse testing methods employed, the techniques for data collection, and the parameters measured during testing. Furthermore, the paper aims to delve into the potential application of machine learning techniques for modelling, estimating, and predicting the reliability of high-power LEDs. The anticipated outcomes of this paper are intended to establish the foundation for the adoption of innovative approaches in reliability testing and to enhance the prediction and estimation of high-power LEDs reliability.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>SC</sub> - Article in a specialist periodical, which is included in the SCOPUS database

  • CEP classification

  • OECD FORD branch

    21100 - Other engineering and technologies

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2025

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    MATEC web of conferences

  • ISSN

    2274-7214

  • e-ISSN

    2261-236X

  • Volume of the periodical

    2025

  • Issue of the periodical within the volume

    413

  • Country of publishing house

    FR - FRANCE

  • Number of pages

    6

  • Pages from-to

  • UT code for WoS article

  • EID of the result in the Scopus database

    2-s2.0-105018047449