Optical characterization of multilayer systems with randomly rough boundaries

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F99%3A00000177" target="_blank" >RIV/00216305:26210/99:00000177 - isvavai.cz</a>
Alternative codes found
RIV/00216224:14310/99:00003217
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Optical characterization of multilayer systems with randomly rough boundaries
Original language description
The method based on measuring and interpeting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of three-layer and thirteen-layer systems exhibiting the randomly rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2.
Czech name
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Czech description
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Project
<a href="/en/project/GA202%2F98%2F0988" target="_blank" >GA202/98/0988: Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
1999
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
18th Congress of the International Commission for Optics: Optics for the Next Millennium
ISBN
0-8194-3234-2
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
SPIE- The international Society for Optical Engineering
Place of publication
San Francisco, California, USA
Event location
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Event date
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Type of event by nationality
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UT code for WoS article
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