Near-field photocurrent spectroscopy: superresolving method for inspection of semiconductor interfaces
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F00%3A42200003" target="_blank" >RIV/00216305:26220/00:42200003 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26220/00:PU37578
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Near-field photocurrent spectroscopy: superresolving method for inspection of semiconductor interfaces
Original language description
The study of spatially resolved near-field photocurrent spectra of Schottky barrier based on the local illumination with different photon energy is presented. Non-topographic features with superresolution have been obtained in the optical near-field. Thenondestructiveness makes this technique also attractive for the analysis of reliability of laser diodes.
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/OC%20523.40" target="_blank" >OC 523.40: Nanostructures: Optical and Electrical Characteristics</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2000
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
CO-MAT-TECH 2000, 8. Medzinárodná vedecká konferencia, vol.4
ISBN
80-227-1413-5
ISSN
—
e-ISSN
—
Number of pages
6
Pages from-to
—
Publisher name
Slovenská technická univerzita v Bratislave
Place of publication
Bratislava
Event location
—
Event date
—
Type of event by nationality
—
UT code for WoS article
—