Investigation of a possible correlation between current noise and long-term stability of thick-film resistors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F00%3APU81244" target="_blank" >RIV/00216305:26220/00:PU81244 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Investigation of a possible correlation between current noise and long-term stability of thick-film resistors
Original language description
Investigation of a possible correlation between current noise and long-term stability of thick-film resistors
Czech name
Investigation of a possible correlation between current noise and long-term stability of thick-film resistors
Czech description
Investigation of a possible correlation between current noise and long-term stability of thick-film resistors
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA103%2F97%2F0899" target="_blank" >GA103/97/0899: Electromagnetic emission and its application in the civil engineering and geophysics</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2000
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proc. European Microelectronics, Packaging and Interconnection Symposium
ISBN
80-238-5509-3
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
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Publisher name
IMAPS
Place of publication
Praha
Event location
Praha
Event date
Jun 18, 2000
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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