Characterization of thick-film interdigitated electrodes
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F01%3APU27730" target="_blank" >RIV/00216305:26220/01:PU27730 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Characterization of thick-film interdigitated electrodes
Original language description
A sensor miniaturization brings many problems e.g. an effect of the double layer capacitance, a serial resistance of electrodes, a cell constant, a roughness of electrodes etc. Nowadays, an interdigitated electrodes (IDES) are used in many sensor's applications [3,4,5]. Interdigitated electrodes have a comb structure of electrode system and are deposited on an substrate in planar technology as the thick-film or the thin-film. In most cases good results were achieved using differential or transient measuurements. Measurement of frequency characteristics is not possible without a correction of the cell constant. Results of our current research show many problems with the behavioural of chemical cells if the comb structure with small sizes is used. Our results show that conductivity measurements need corrections of the cell constant for each concentration of a liquid solution. This paper investigates how sizes of IDES electrodes influence the interface impedance. Variation of the cell siz
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
CG - Electrochemistry
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F00%2F0939" target="_blank" >GA102/00/0939: Integrated intelligent microsensors and microsystems</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
th Electronic Devices and Systems Conference 2001 and Noise and Non-linearity Testing of modern Electronics Component
ISBN
80-214-1960-1
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
264-268
Publisher name
Ing.Zdeněk Novotný,CSc.
Place of publication
Brno
Event location
Brno
Event date
Sep 12, 2001
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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