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Characterization of thick-film interdigitated electrodes

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F01%3APU27730" target="_blank" >RIV/00216305:26220/01:PU27730 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Characterization of thick-film interdigitated electrodes

  • Original language description

    A sensor miniaturization brings many problems e.g. an effect of the double layer capacitance, a serial resistance of electrodes, a cell constant, a roughness of electrodes etc. Nowadays, an interdigitated electrodes (IDES) are used in many sensor's applications [3,4,5]. Interdigitated electrodes have a comb structure of electrode system and are deposited on an substrate in planar technology as the thick-film or the thin-film. In most cases good results were achieved using differential or transient measuurements. Measurement of frequency characteristics is not possible without a correction of the cell constant. Results of our current research show many problems with the behavioural of chemical cells if the comb structure with small sizes is used. Our results show that conductivity measurements need corrections of the cell constant for each concentration of a liquid solution. This paper investigates how sizes of IDES electrodes influence the interface impedance. Variation of the cell siz

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    CG - Electrochemistry

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA102%2F00%2F0939" target="_blank" >GA102/00/0939: Integrated intelligent microsensors and microsystems</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2001

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    th Electronic Devices and Systems Conference 2001 and Noise and Non-linearity Testing of modern Electronics Component

  • ISBN

    80-214-1960-1

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    264-268

  • Publisher name

    Ing.Zdeněk Novotný,CSc.

  • Place of publication

    Brno

  • Event location

    Brno

  • Event date

    Sep 12, 2001

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article