Nanometric applications of the Scanning Near-field Optical Microscopy

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU29545" target="_blank" >RIV/00216305:26220/02:PU29545 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Nanometric applications of the Scanning Near-field Optical Microscopy
Original language description
Scaning near-field optical microscopy elucidates to the interaction of light with a sample close to an aperture, which constrains the lateral extent of the light beam. The aperture is held in place in a manner similar to those used for other scanning proximal probe microscopes. Advantages of the near-field interactions are: improved spatial resolution, simultaneous topographic image, surface enhancement, rapidly varying electric fields, and the presence of an electric field normal to the surface. some ppractical applications, e.g. single molecule detection, Raman scattering, polarization, magnetic imaging, data storage, biological imaging, quantum dots and quantum lines, nanolithography, photonic devices characterization are presented.
Czech name
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Czech description
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Project
<a href="/en/project/OC%20523.40" target="_blank" >OC 523.40: Nanostructures: Optical and Electrical Characteristics</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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