X-RAY MICROANALYSIS IN ESEM AND LV SEM

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU30338" target="_blank" >RIV/00216305:26220/02:PU30338 - isvavai.cz</a>

Alternative codes found

RIV/68081731:_____/02:12020059

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

X-RAY MICROANALYSIS IN ESEM AND LV SEM

Original language description

This article presents the advantageous metod for the X-ray microanalysis in ESEM which enables to assess the true specimen composition via mesurement of 4 or 5 values of the counts per second for different pressures.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA102%2F01%2F1271" target="_blank" >GA102/01/1271: Study of detection methods and systems in extreme conditions of environmental scanning electron microscopy</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2002

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

ISBN

80-238-8986-9

ISSN

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e-ISSN

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Number of pages

2

Pages from-to

49-50

Publisher name

Institute of Scientific Instruments Academy of Sciences of the Czech republic, Czechoslovak Microscopy Society

Place of publication

Czech republic, Brno

Event location

Skalský Dvůr

Event date

Jul 8, 2002

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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