Noise spectroscopy of thick film

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU30669" target="_blank" >RIV/00216305:26220/02:PU30669 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Noise spectroscopy of thick film
Original language description
Fluctuations of current and light emission in electroluminescent lamps based of zinc sulfide phosphor powder embedded in a dielectric layer are presented. Noise sources are emission of electrons from localised levels in the gap, impact excitation and impact ionisation of luminiscence centers and radiative transition by hot carriers. Due to high electric field, partial discharges are also sources of current fluctuations. Crystal defects, such as pores, grain boundaries and dislocations may provide regionns, where a localised continuum of states bridges the energy gap and allow non-radiative recombination, which is related to current fluctuation. Noise spectroscopy is used to estimate the quality and reliability of thick electroluminiscent layers. In these devices, the overall efficiency is further degraded by absorption, internal reflection and other losses. Brightness versus applied voltage and frequency is used to describe the degradation process and correlation with noise spectral de
Czech name
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Czech description
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Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Noise and Non-linearity Testing of Modern Electronic Componets
ISBN
80-2389094-8
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
71-72
Publisher name
Ing.Zdeněk Novotný, CSc.
Place of publication
Brno
Event location
Brno
Event date
Sep 12, 2001
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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