Low Frequency Noise of Tantalum Capacitors

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU31485" target="_blank" >RIV/00216305:26220/02:PU31485 - isvavai.cz</a>

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

Low Frequency Noise of Tantalum Capacitors

Original language description

In the system partial discharges appear with stochastic behaviour. In time domain this fluctuations are realized by current pulses with random amplitude and random time interval between consecutive pulses. Their probability statistics depends on the timevariation of the applied voltage. For DC voltage the pulse occurrence is rather low, while for ramp voltage the average pulse rate is directly proportional to the voltage rate. In the latter case the polarization current is constant. From this point ofview the fluctuations are proportional to the polarization current value. The partial discharges create irreversible process, which can lead to the breakdown. The occurrence of current pulses and their magnitude are used as reliability indicator.

Czech name

—

Czech description

—

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

—

Project

—

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2002

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Active and Passive Electronic ComponentsISSN

ISSN

0882-7516

e-ISSN

—

Volume of the periodical

25

Issue of the periodical within the volume

2

Country of publishing house

GR - GREECE

Number of pages

7

Pages from-to

161-167

UT code for WoS article

—

EID of the result in the Scopus database

—