Critical role of near-field optics in the characterization of electro-optical devices
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU38399" target="_blank" >RIV/00216305:26220/03:PU38399 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Critical role of near-field optics in the characterization of electro-optical devices
Original language description
In applications as diverse as waveguide and quantum-dot analysis, the local NSOM technique offers resolution beyond that possible with conventional confocal microscopy. The NSOM data of the active region of the waveguide are presented.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ME%20544" target="_blank" >ME 544: Semiconductors - local optical and electrical properties</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Radioelektronika 2003 Conference proceedings
ISBN
80-214-2388-8
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
280-283
Publisher name
MJ Servis Ltd.
Place of publication
Brno
Event location
Brno
Event date
May 6, 2003
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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