Microelectronic structure reliability evaluation using response surface methodology
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU38802" target="_blank" >RIV/00216305:26220/03:PU38802 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Microelectronic structure reliability evaluation using response surface methodology
Original language description
The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empiricalstudy approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GP102%2F03%2FP124" target="_blank" >GP102/03/P124: Empirical models for multiparametric evaluation of quality parameters</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
10th Electronic Devices and Systems Conference 2003
ISBN
8021424524
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
166-169
Publisher name
Zdeněk Novotný
Place of publication
Brno
Event location
Brno
Event date
Sep 9, 2003
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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