ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU39306" target="_blank" >RIV/00216305:26220/03:PU39306 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER

Original language description

High-precise industrial distance measurements by means of laser interferometer with a single-frequency He-Ne laser are used very often. Main disadvantage of that method is necessity to travel with a measuring retroreflector of Michelson interferometer across the measurement distance. On the other hand a narrow linewidth, frequency stability and beam shape of He-Ne laser lead to an ultra-high resolution below 1 nm [1]. In contrast to this conventional interferometry, the other one based on a tunable laseer source allows to detect distances in a static way without moving the reflector. In this case, the moving process is replaced by tuning of the wavelength of laser source at front of Michelson interferometer. Then the synthetic wavelength, which is limited by a continuous tunable range of the laser, determines the scale resolution of the absolute distance interferometer.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

1st International Meeting on Applied Physics

ISBN

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ISSN

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e-ISSN

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Number of pages

1

Pages from-to

979-979

Publisher name

Formatex

Place of publication

Španělsko

Event location

Badajoz , Španělsko

Event date

Oct 13, 2003

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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