The Comparison between Noise Spectroscopy and LBIC
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU43752" target="_blank" >RIV/00216305:26220/04:PU43752 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26110/04:PU44911
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
The Comparison between Noise Spectroscopy and LBIC
Original language description
The noise spectroscopy and LBIC are a pair of the useful methods to provide a non-destructive characterization on semiconductor materials and devices. The actual reliability of electronic devices is usually lower than the maximum theoretical value of reliability, depending on the attained manufacture level. It may be due to irregularities in manufacturing processes. The defects are the natural sources of the excess current and excess noise and they are responsible for the change of several measurable quuantities. LBIC measurement for solar cell local characterization has been developed and tested on mono-crystalline Si solar cells. A solar cell is illuminated by a focused laser. The response (current or potential) of the solar cell is measured at fixedconditions (during scanning). We have studied two groups of silicon solar cells: good and wrong standard parameters of solar cells. In this part we describe our study of comparison between noise spectroscopy and LBIC.
Czech name
Porovnání šumové spektroskopie a LBIC
Czech description
Šumová spektroskopie a LBIC jsou používané metody k poskytnutí nedestruktivního testování polovodičových materiálů a zařízení.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F04%2F0142" target="_blank" >GA102/04/0142: Noise spectroscopy for fast non-destructive testing of solar cells quality, reliability and service lifetime</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2004
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
The 11th Electronic Devices and Systems Conference
ISBN
80-214-2701-9
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
454-457
Publisher name
MSD
Place of publication
Brno
Event location
Brno
Event date
Sep 9, 2004
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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