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The Comparison between Noise Spectroscopy and LBIC

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU43752" target="_blank" >RIV/00216305:26220/04:PU43752 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216305:26110/04:PU44911

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    The Comparison between Noise Spectroscopy and LBIC

  • Original language description

    The noise spectroscopy and LBIC are a pair of the useful methods to provide a non-destructive characterization on semiconductor materials and devices. The actual reliability of electronic devices is usually lower than the maximum theoretical value of reliability, depending on the attained manufacture level. It may be due to irregularities in manufacturing processes. The defects are the natural sources of the excess current and excess noise and they are responsible for the change of several measurable quuantities. LBIC measurement for solar cell local characterization has been developed and tested on mono-crystalline Si solar cells. A solar cell is illuminated by a focused laser. The response (current or potential) of the solar cell is measured at fixedconditions (during scanning). We have studied two groups of silicon solar cells: good and wrong standard parameters of solar cells. In this part we describe our study of comparison between noise spectroscopy and LBIC.

  • Czech name

    Porovnání šumové spektroskopie a LBIC

  • Czech description

    Šumová spektroskopie a LBIC jsou používané metody k poskytnutí nedestruktivního testování polovodičových materiálů a zařízení.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA102%2F04%2F0142" target="_blank" >GA102/04/0142: Noise spectroscopy for fast non-destructive testing of solar cells quality, reliability and service lifetime</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    The 11th Electronic Devices and Systems Conference

  • ISBN

    80-214-2701-9

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    454-457

  • Publisher name

    MSD

  • Place of publication

    Brno

  • Event location

    Brno

  • Event date

    Sep 9, 2004

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article