Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU44468" target="_blank" >RIV/00216305:26220/04:PU44468 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes
Original language description
Transport and noise characteristic of forward biased 2.3 CW GaSb laser diodes were measured in order to evaluate new technology.
Czech name
Nízkofrekvenční šum a I-V charakteristiky použité jako analytický nástroj 2.3 microm CW GaSb LASER diod
Czech description
viz anotace v angličtině

Project
<a href="/en/project/GA102%2F04%2F0142" target="_blank" >GA102/04/0142: Noise spectroscopy for fast non-destructive testing of solar cells quality, reliability and service lifetime</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2004
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Research Activities f Physics Departments of Civil Engineering Faculties in the Czech and Slovak Republic
ISBN
80-7204-353-6
ISSN
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e-ISSN
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Number of pages
3
Pages from-to
184-186
Publisher name
Akademické nakladatelství CERM
Place of publication
Czech Republic, Cigháj
Event location
Cigháj
Event date
Sep 14, 2004
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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Result description