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Low Frequency Noise of the CdTe Crystals

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU52498" target="_blank" >RIV/00216305:26220/05:PU52498 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216208:11320/05:00000995

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Low Frequency Noise of the CdTe Crystals

  • Original language description

    Experimental studies of transport and noise characteristics of CdTe bulk single crystals have been carried out. The noise measurement was used to characterized the quality of sample surface and contact technology. As a quality indicator we have choose the 1/f noise. In this case the 1/f noise is generated in sample volume, on surface and contacts. The main problem to be solved was the separation of these noise sources. The noise spectral density was measured by four probe method to separate contact noisse from the other sources. To distinguish between 1/f noise generated in sample volume and on the surface the noise measurement was performed as a function of incident light wavelengths for constant electric field and current was varied both by the sample illumination and photon energy change. There are three different 1/f noise sources: (i)bulk 1/f noise generated by sub band gap energy photons with current noise spectral density proportional to first power of current, (ii)surface 1/f n

  • Czech name

    Nízkofrekvenční šum v krystalech CdTe

  • Czech description

    Článek pojednává o experimentálním studiu transportu a šumových charakteristik v objemu krastalů CdTe. Šumové charakteristiky jsou mírou kvality povrchu vzorků a jejich kontaktů. Jako indikátor spolehlivosti jsme vybrali 1/f šum, který vzniká v objemu ana kontaktech. Hlavní problém je ve zjišťování příspěvku těchto zdrojů do celké úrovně 1/f šumu.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2005

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Noise and Fluctuations

  • ISBN

    0-7354-0267-1

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    175-178

  • Publisher name

    American Institute of Physics

  • Place of publication

    Salamanca, Spain

  • Event location

    Salamanca, Spain

  • Event date

    Sep 19, 2005

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article