Low Frequency Noise Measuring in Semiconductor Devices

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F07%3APU70069" target="_blank" >RIV/00216305:26220/07:PU70069 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—

Result language
angličtina
Original language name
Low Frequency Noise Measuring in Semiconductor Devices
Original language description
The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.
Czech name
Mereni Nizkofrekvencniho Sumu v Polovodicich
Czech description
The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.

Project
<a href="/en/project/GA102%2F07%2F0113" target="_blank" >GA102/07/0113: Noise as Diagnostic Tool for Schottky and Could Electron Emission Cathodes</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2007
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Similar results(10)