Optical methods for extreme level measurement
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F07%3APU71032" target="_blank" >RIV/00216305:26220/07:PU71032 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Optical methods for extreme level measurement
Original language description
There are certain optical methods for the measurement of ultra-short solitary electromagnetic pulses or low-level measurement. The measurement methods properties have to correspond to the fact of whether we want to measure pulses of voltage, current or afree-space electromagnetic wave. The need for specific measurement methods occurred owing to the development of high power microwave pulse generator. Certain applicable methods are presented in this paper. For the same purpose, the magneto-optic methodcan be utilized with respect to its advantages. For the measurement of the output microwave pulse of the generator, the optical method was designed and realized. Low-level optical measurement methods were used for nano-layers measurement and experimentally verified with regard to air ion concentration test.
Czech name
Optické metody pro měření extrémních signálů
Czech description
There are certain optical methods for the measurement of ultra-short solitary electromagnetic pulses or low-level measurement. The measurement methods properties have to correspond to the fact of whether we want to measure pulses of voltage, current or afree-space electromagnetic wave. The need for specific measurement methods occurred owing to the development of high power microwave pulse generator. Certain applicable methods are presented in this paper. For the same purpose, the magneto-optic methodcan be utilized with respect to its advantages. For the measurement of the output microwave pulse of the generator, the optical method was designed and realized. Low-level optical measurement methods were used for nano-layers measurement and experimentally verified with regard to air ion concentration test.
Classification
Type
D - Article in proceedings
CEP classification
JB - Sensors, detecting elements, measurement and regulation
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2007
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2007 International Waveform Diversity and Design Conference
ISBN
1-4244-1276-5
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
131-135
Publisher name
IEEE
Place of publication
Pisa, Italy
Event location
Pisa, Italy
Event date
Jun 4, 2007
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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