Relaxation Time in CdTe Single Crystals

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU74427" target="_blank" >RIV/00216305:26220/08:PU74427 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Relaxation Time in CdTe Single Crystals

Original language description

Bulk resistance decay of two cadmium telluride single crystals was investigated. Each CdTe crystal has four golden contacts, two current contacts and two voltage contacts. That allows us to distinguish between bulk resistance and contact area. The bulk resistance of each CdTe single crystal was measured during long time interval with an applied voltage U = 16 V. Detectors were placed into a cryostat. That allowed to hold the temperature constant during the measurements and eliminate the illumination influence. The temperature of the samples was 300 K at first and after some period of time (approximately 1 day) it was sharply raised to 390 K. We observed the resistance slow decreasing with time with temperature T = 300 K and T = 390 K. All the samples have very high value of relaxation time. The presented samples must have not one but four acceptor or donor levels, some of them are deep levels. We have discovered that the interactions between the valence band and deep acceptor levels or

Czech name

Relaxační doba v monokrystalech CdTe

Czech description

Bulk resistance decay of two cadmium telluride single crystals was investigated. Each CdTe crystal has four golden contacts, two current contacts and two voltage contacts. That allows us to distinguish between bulk resistance and contact area. The bulk resistance of each CdTe single crystal was measured during long time interval with an applied voltage U = 16 V. Detectors were placed into a cryostat. That allowed to hold the temperature constant during the measurements and eliminate the illumination influence. The temperature of the samples was 300 K at first and after some period of time (approximately 1 day) it was sharply raised to 390 K. We observed the resistance slow decreasing with time with temperature T = 300 K and T = 390 K. All the samples have very high value of relaxation time. The presented samples must have not one but four acceptor or donor levels, some of them are deep levels. We have discovered that the interactions between the valence band and deep acceptor levels or

Type

D - Article in proceedings

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/GA102%2F07%2F0113" target="_blank" >GA102/07/0113: Noise as Diagnostic Tool for Schottky and Could Electron Emission Cathodes</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2008

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

ISSE 2008 Reliability and Life-time Prediction

ISBN

978-963-06-4915-5

ISSN

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e-ISSN

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Number of pages

2

Pages from-to

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Publisher name

Zsolt Illyefalvi-Vitez

Place of publication

Budapest, Hungary

Event location

Budapest

Event date

May 7, 2008

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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