Subpixel Edge Detection with Optimized Fresnel Edge Fitting Method and Double Calibration Method

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU75258" target="_blank" >RIV/00216305:26220/08:PU75258 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Subpixel Edge Detection with Optimized Fresnel Edge Fitting Method and Double Calibration Method
Original language description
The purpose of this article is to introduce two different approaches for a subpixel measurement of mesh dimensions in the industrial sieves. The first method is based on an exact theoretical analysis of an imaging optics. The laws of the Geometric and Fourier optics were used for analysis of the imaging process. Main results of the analysis are presented in this article. The second method is based on a double calibration of the measuring system. Both methods were practically tested on the prototype of 2D tester and results and our experience are briefly discussed in conclusion.
Czech name
Subpixelová detekce hrany metodou Fresnelovy aproximace hrany a metodou Dvojité kalibrace
Czech description
Popis dvou nově vyvinutých metod detekce subpixelové pozice hrany v obraze získaném telecentrickým měřícím systémem.

Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
31st International Conference on TELECOMMUNICATIONS AND SIGNAL PROCESSING TSP 2008
ISBN
978-963-06-5487-6
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
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Publisher name
Budapest University of Technology and Economics
Place of publication
Budapest
Event location
Parádfürdő
Event date
Sep 3, 2008
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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