Long Term Stability of Polymer Based Resistors Tested by Noise, Non-Linearity and Electro-Ultrasonic Spectroscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU81661" target="_blank" >RIV/00216305:26220/09:PU81661 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Long Term Stability of Polymer Based Resistors Tested by Noise, Non-Linearity and Electro-Ultrasonic Spectroscopy
Original language description
The long term stability of polymer based thick film resistors was correlated with the results of standard testing methods: the low frequency noise measurements, non-linearity and new proposed method: Electro-Ultrasonic Spectroscopy. The samples were madeusing different resistive and conducting pastes. The resistive pastes were made using one type of conducting grains - carbon and graphite particles, suspended in different polymer vehicles. Contacts were made by polymer based dipping silver. The resultsof standard measuring methods are compared with those of the electro-ultrasonic spectroscopy. This method is based on the phonon interaction with conducting electrons and on the change of the contact area among the conducting particles. The ultrasonic signal changes the contact area between the conducting grains in the resistor structure and then the resistance is modulated by the frequency of ultrasonic excitation. Resultant intermodulation voltage appearing on the sample depends on th
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BE - Theoretical physics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GD102%2F09%2FH074" target="_blank" >GD102/09/H074: Diagnostics of material defects using the latest defectoscopic methods</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
17th European Microelectronics and Packaging Conference & Exhibition
ISBN
978-1-4244-4722-0
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
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Publisher name
Neuveden
Place of publication
Italie
Event location
Rimini
Event date
Jun 15, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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