THICK FILM RESISTORS NDT BY ELECTRO-ULTRASONIC SPECTROSCOPY

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU83436" target="_blank" >RIV/00216305:26220/09:PU83436 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
THICK FILM RESISTORS NDT BY ELECTRO-ULTRASONIC SPECTROSCOPY
Original language description
The non-linear electro-ultrasonic spectroscopy was used as a non-destructive testing method for the polymer based and cermet thick film resistors evaluation. We carried out the correlation between this method and standard testing methods as noise spectroscopy and the third harmonic voltage measurements. The measuring set-up with the ultrasonic transducer working on the frequency range 10 kHz to 1 MHz was designed and realized. Proposed method is exploiting two different signal sources - ultrasonic waveand alternating electric current. Mechanical vibrations affect the defects in the sample structure and it influences the electric charge transport through the measured structure. Resulting information is measured on the differential frequency given by the superposition or subtraction of exciting signals frequencies. Low-pass filter with limit frequency 5 kHz was used for the suppression of exciting signals amplitudes. Measured sample together with the ultrasonic transducer creates the re
Czech name
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Czech description
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Project
<a href="/en/project/GD102%2F09%2FH074" target="_blank" >GD102/09/H074: Diagnostics of material defects using the latest defectoscopic methods</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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