Diagnostic methods of solar cells in dependence on temperature

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU83980" target="_blank" >RIV/00216305:26220/09:PU83980 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Diagnostic methods of solar cells in dependence on temperature

Original language description

This study is focused on testing methods determining quality of solar cells. Nowadays the development of solar cells is much faster and there is still necessary to increase their quality by removing causes of materials defects and also defects in a process of their production. Non-destructive methods are used for correct determination of defects by using of recombination effect of charge carrier in PN junction

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA102%2F09%2F0859" target="_blank" >GA102/09/0859: Local Light Emission in Association with Stochastic Processes in PN Junction in Solar Cells at Cryo Temperature.</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Proceedings of SPIE

ISSN

0277-786X

e-ISSN

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Volume of the periodical

2009

Issue of the periodical within the volume

7412

Country of publishing house

US - UNITED STATES

Number of pages

8

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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