Automatic Analysis of Defect Types in LBIC and Electroluminiscence Images

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU84577" target="_blank" >RIV/00216305:26220/09:PU84577 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—

Result language
angličtina
Original language name
Automatic Analysis of Defect Types in LBIC and Electroluminiscence Images
Original language description
This paper deals with the possibility of the defect analyze automation in the images taken by the luminescence or LBIC, LBIV methods. During the manufacturing of solar cell there is possible to make a lot of useful analysis of the quality of used material and technology processes. Among methods that are displaying distribution of defect in the structure we can count the photoluminescence, which is possible to use on uncontacted material, electroluminescence and LBIC (Light Beam Induced Current) eventually LBIV (Light Beam Induced Voltage) which can be used on contact made solar cells.
Czech name
—
Czech description
—

Project
<a href="/en/project/GA102%2F09%2F0859" target="_blank" >GA102/09/0859: Local Light Emission in Association with Stochastic Processes in PN Junction in Solar Cells at Cryo Temperature.</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
24th European Photovoltaic Solar Energy Conference and Exhibition
ISBN
3-936338-25-6
ISSN
—
e-ISSN
—
Number of pages
3
Pages from-to
—
Publisher name
WIT-Renewabel Energies
Place of publication
Hamburg, Německo
Event location
Hamburg
Event date
Sep 20, 2009
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
—

Similar results(10)