Comparisons of Noise Spectroscopy Analyze and Microplasma Noise Sources
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU87502" target="_blank" >RIV/00216305:26220/10:PU87502 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Comparisons of Noise Spectroscopy Analyze and Microplasma Noise Sources
Original language description
As it was the mechanical noise used for diagnostic od machine in teh past, the electronic noise can by used as diagnostic tool for detection of defectes in electronical deveces and systems in teh future. This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three type of solar cells.
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/GA102%2F09%2F0859" target="_blank" >GA102/09/0859: Local Light Emission in Association with Stochastic Processes in PN Junction in Solar Cells at Cryo Temperature.</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
27th International Conference on microelectronics
ISBN
978-1-4244-7200-0
ISSN
—
e-ISSN
—
Number of pages
5
Pages from-to
—
Publisher name
IEEE Serbie
Place of publication
Niš, Serbie
Event location
Niš
Event date
May 16, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—