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Design of Lightning Systems with Usage Sensitivity Analysis for Improvement of Numerical Model

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU93396" target="_blank" >RIV/00216305:26220/11:PU93396 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Design of Lightning Systems with Usage Sensitivity Analysis for Improvement of Numerical Model

  • Original language description

    The paper presents usage of the R-FEM method in the CFX environment. There is describes usage of the sensitivity analysis for improvement of numerical model and change dimensions of numerical model according to radiation pattern and required light distribution. The R-FEM method was used for modeling of special light sources and to compute lighting of surfaces from these sources with very good results. Basic description of the R-FEM method is described below. For modeling of the light sources in the CFXenvironment was used combination of the Finite Volume Method and the radiation method which are included with the CFX (The Discrete Transfer Model and The Monte Carlo Model). Numerical results are presented by model of head-lamp. Sensitivity analysis wasused to change dimensions of numerical model according to lighting distribution.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Progress In Electromagnetics

  • ISSN

    1559-9450

  • e-ISSN

  • Volume of the periodical

    2011

  • Issue of the periodical within the volume

    2011

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    5

  • Pages from-to

    465-468

  • UT code for WoS article

  • EID of the result in the Scopus database