Determining Effective Testability Degree of Analog Circuits

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU98582" target="_blank" >RIV/00216305:26220/12:PU98582 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Determining Effective Testability Degree of Analog Circuits
Original language description
The paper deals with the parametric fault diagnosis of linear analog circuits in the frequency domain. The testability degree, which is referred to as the total number of testable network parameters, is theoretically independent of nominal values of network parameters, the set of test frequencies and the fault detection method. However, practical results show that the effective testability determined numerically using the Singular Value Decomposition of sensitivity matrix (Jacobian) depends on the normalization of network parameters, frequency response measurement methods and a selected set of test frequencies. The differences between the theoretical and the practical testability degree will be discussed on a practical example of RC phase shifter filter.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems
ISBN
978-1-4577-2092-5
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
427-430
Publisher name
Technical University of Lodz
Place of publication
Warsaw
Event location
Varšava
Event date
May 24, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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