Scintillation Secondary Electron Detector For ESEM And SEM
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU99286" target="_blank" >RIV/00216305:26220/12:PU99286 - isvavai.cz</a>
Alternative codes found
RIV/68081731:_____/12:00383890
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Scintillation Secondary Electron Detector For ESEM And SEM
Original language description
This article is foccused on introduction of advantages of scintillation SE detector as a detoctor for SEM and ESEM.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
MICROSCOPY AND MICROANALYSIS
ISSN
1431-9276
e-ISSN
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Volume of the periodical
2012 (18)
Issue of the periodical within the volume
Suppl 2
Country of publishing house
US - UNITED STATES
Number of pages
2
Pages from-to
1266-1267
UT code for WoS article
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EID of the result in the Scopus database
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