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Near electromagnetic field measurement of microprocessor

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F13%3APU102426" target="_blank" >RIV/00216305:26220/13:PU102426 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Near electromagnetic field measurement of microprocessor

  • Original language description

    The article describe systematically the electromagnetic (EM) side channels sources and electromagnetic field of the microprocessor and is focused on the best way how to measure the near electromagnetic field of microprocessor. It was suggested and realized several electromagnetic probes and it was performed the measurement regarded to the theoretical background on the testbed with cryptographic module (microprocessor) performed the Advanced Encryption Standard (AES). On the measured waveforms of the electromagnetic emission was studied the influence of probe construction namely two parameters wire diameter and number of turns. In following measurement was studied how induced voltage depending on the distance of measuring coil to microprocessor and thelast measurement dealt with position of probe and microchip.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Przeglad Elektrotechniczny

  • ISSN

    0033-2097

  • e-ISSN

  • Volume of the periodical

    2013

  • Issue of the periodical within the volume

    02

  • Country of publishing house

    PL - POLAND

  • Number of pages

    5

  • Pages from-to

    203-207

  • UT code for WoS article

  • EID of the result in the Scopus database