Near electromagnetic field measurement of microprocessor
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F13%3APU102426" target="_blank" >RIV/00216305:26220/13:PU102426 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Near electromagnetic field measurement of microprocessor
Original language description
The article describe systematically the electromagnetic (EM) side channels sources and electromagnetic field of the microprocessor and is focused on the best way how to measure the near electromagnetic field of microprocessor. It was suggested and realized several electromagnetic probes and it was performed the measurement regarded to the theoretical background on the testbed with cryptographic module (microprocessor) performed the Advanced Encryption Standard (AES). On the measured waveforms of the electromagnetic emission was studied the influence of probe construction namely two parameters wire diameter and number of turns. In following measurement was studied how induced voltage depending on the distance of measuring coil to microprocessor and thelast measurement dealt with position of probe and microchip.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Przeglad Elektrotechniczny
ISSN
0033-2097
e-ISSN
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Volume of the periodical
2013
Issue of the periodical within the volume
02
Country of publishing house
PL - POLAND
Number of pages
5
Pages from-to
203-207
UT code for WoS article
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EID of the result in the Scopus database
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