Artifact removal by local extrema detection in images from electron microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F14%3APU110045" target="_blank" >RIV/00216305:26220/14:PU110045 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Artifact removal by local extrema detection in images from electron microscopy
Original language description
Processing of images from electron microscopy is important for a succesful analysis of acquired output. As with the majority of digital signals, these are plagued by various types of noise or artifacts. This paper concerns the detection and removal of artifacts created by sample contamination and the following reverse edge detection for displaying image segmentation.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
STUDENT EEICT, Proceedings of the 20th conference, Volume 3
ISBN
978-80-214-4922-0
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
31-35
Publisher name
LITERA
Place of publication
Tábor 43a, 612 00, Brno
Event location
Brno
Event date
Apr 24, 2014
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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