Scanning Probe Microscopy in Technology of Solar Cells Production
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F14%3APU111819" target="_blank" >RIV/00216305:26220/14:PU111819 - isvavai.cz</a>
Result on the web
<a href="http://www.electroscope.zcu.cz" target="_blank" >http://www.electroscope.zcu.cz</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Scanning Probe Microscopy in Technology of Solar Cells Production
Original language description
This article deals with implementation of SPM techniques (AFM and KPFM) to the characterization of crystalline silicon solar cells.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
ElectroScope - http://www.electroscope.zcu.cz
ISSN
1802-4564
e-ISSN
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Volume of the periodical
2014
Issue of the periodical within the volume
3
Country of publishing house
CZ - CZECH REPUBLIC
Number of pages
6
Pages from-to
1-6
UT code for WoS article
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EID of the result in the Scopus database
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