Hybrid architecture of microcode memory Built-In Self Test

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F18%3APU127809" target="_blank" >RIV/00216305:26220/18:PU127809 - isvavai.cz</a>
Result on the web
<a href="http://www.elektrorevue.cz/cz/clanky/informacni-technologie/0/hybrid-architecture-of-microcode-memory-built-in-self-test/" target="_blank" >http://www.elektrorevue.cz/cz/clanky/informacni-technologie/0/hybrid-architecture-of-microcode-memory-built-in-self-test/</a>
DOI - Digital Object Identifier
—

Result language
angličtina
Original language name
Hybrid architecture of microcode memory Built-In Self Test
Original language description
March tests are a popular method to test semiconductor memory for defects, but they’re originally designed to only work on bit-oriented memories. For practical use march tests have been extended for use on word-oriented memories. This extension is done by either using multiple test data vectors and their inversions, or by using serial march test. These tests access each data word in memory as a shift register. This paper is proposing a microcode-controlled built-in self test architecture that allows us to use both access methods during a single test.
Czech name
—
Czech description
—

Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical
Elektrorevue - Internetový časopis (http://www.elektrorevue.cz)
ISSN
1213-1539
e-ISSN
—
Volume of the periodical
20
Issue of the periodical within the volume
2
Country of publishing house
CZ - CZECH REPUBLIC
Number of pages
6
Pages from-to
36-41
UT code for WoS article
—
EID of the result in the Scopus database
—

Similar results(10)