Silicon in spectroscopic data of world databases
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F18%3APU130510" target="_blank" >RIV/00216305:26220/18:PU130510 - isvavai.cz</a>
Result on the web
<a href="http://ppt.fel.cvut.cz" target="_blank" >http://ppt.fel.cvut.cz</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Silicon in spectroscopic data of world databases
Original language description
This article deals with comparison of three world spectroscopic databases: NIST, Kurucz and Atomic Line List. Our target was to calculate the differences in input data and the ratio of Stark broadening and function F which depends on electron density, temperature and pressure. Stark broadening is one of pressure broadenings of spectral lines which arise from the collisions of the emitters with neighboring particles. Stark broadening is due to charged perturbers. We developed the program NKrov to be able to compare data in databases. There were some differences in the database format and content. Our results could be used in science and technology.
Czech name
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Czech description
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Classification
Type
J<sub>ost</sub> - Miscellaneous article in a specialist periodical
CEP classification
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OECD FORD branch
10305 - Fluids and plasma physics (including surface physics)
Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Plasma Physics and Technology
ISSN
2336-2626
e-ISSN
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Volume of the periodical
5
Issue of the periodical within the volume
3
Country of publishing house
CZ - CZECH REPUBLIC
Number of pages
5
Pages from-to
117-121
UT code for WoS article
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EID of the result in the Scopus database
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