Transient Simulation of Scanning Electrochemical Microscope

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F20%3APU138344" target="_blank" >RIV/00216305:26220/20:PU138344 - isvavai.cz</a>
Result on the web
<a href="https://iopscience.iop.org/article/10.1149/09901.0457ecst" target="_blank" >https://iopscience.iop.org/article/10.1149/09901.0457ecst</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1149/09901.0457ecst" target="_blank" >10.1149/09901.0457ecst</a>

Result language
angličtina
Original language name
Transient Simulation of Scanning Electrochemical Microscope
Original language description
The presented article describes a transient numerical model of a scanning electrochemical microscope used for investigating topography and conductivity of various surfaces. The custom numerical model, implemented into Ansys Fluent software, is based on Poisson-Nernst-Planck equations coupled with electrochemical reactions. Presented simulations investigate the influence of irregularities on the scanned surface. Simulations were carried out for different cases with arrangement of conducting and insulating surfaces.
Czech name
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Czech description
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Type
D - Article in proceedings
CEP classification
—
OECD FORD branch
10405 - Electrochemistry (dry cells, batteries, fuel cells, corrosion metals, electrolysis)

Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
21st International Conference on Advanced Batteries, Accumulators and Fuel Cells (ABAF 2020)
ISBN
978-1-60768-909-6
ISSN
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e-ISSN
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Number of pages
8
Pages from-to
457-464
Publisher name
ECS Transactions
Place of publication
Neuveden
Event location
Brno
Event date
Sep 6, 2020
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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