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Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F21%3APU141315" target="_blank" >RIV/00216305:26220/21:PU141315 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.html" target="_blank" >https://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.html</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1051/e3sconf/202129504009" target="_blank" >10.1051/e3sconf/202129504009</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers

  • Original language description

    In this study a comparison of the topography of BiFeO3 (BFO) thin films deposited on tantalum pentoxide substrates of different thicknesses is provided. The Ta2O5 substrates had a roughness increasing with the film thickness. The relationship between substrates of different topography but the same composition with the quality of the growing bismuth ferrite film is estimated. For the first time the topography estimation of BFO on Ta2O5 is presented. The difference in temperature expansion coefficients leads to intensive evaporation of bismuth ferrite from the surface during annealing. XPS analysis is provided for asdeposited and annealed BFO layers.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20506 - Coating and films

Result continuities

  • Project

    <a href="/en/project/LM2018110" target="_blank" >LM2018110: CzechNanoLab research infrastructure</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2021

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    International Scientific Forum on Sustainable Development and Innovation (WFSDI 2021)

  • ISBN

  • ISSN

    2267-1242

  • e-ISSN

  • Number of pages

    7

  • Pages from-to

    1-7

  • Publisher name

    EDP Sciences

  • Place of publication

    neuveden

  • Event location

    Patras

  • Event date

    Jul 10, 2021

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article