Effect of Localized Electrode/Pulp Tissue Conditions on Bipolar Measurements of Banana Samples Electrical Impedance
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F23%3APU148528" target="_blank" >RIV/00216305:26220/23:PU148528 - isvavai.cz</a>
Result on the web
<a href="https://ieeexplore.ieee.org/document/10115192" target="_blank" >https://ieeexplore.ieee.org/document/10115192</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/SoutheastCon51012.2023.10115192" target="_blank" >10.1109/SoutheastCon51012.2023.10115192</a>
Alternative languages
Result language
angličtina
Original language name
Effect of Localized Electrode/Pulp Tissue Conditions on Bipolar Measurements of Banana Samples Electrical Impedance
Original language description
Impedance measurements collected using bipolar electrode configurations represent both tissue/electrode interface impedance and the impedance of tissues between electrodes. To evaluate how localized electrode/tissue interface conditions can impact measurements and their interpretation, electrical impedance of banana pulp samples with varying conditions of decaying tissue and electrode configurations were collected and compared. Changes in tissue impedance (represented as changes in the Cole-impedance model parameters) confirm that pulp samples with higher quantities of decaying tissue have lower resistance and higher peak frequency. Results support that while measurements are influenced by the localized electrode/tissue interface they are not dominated by them.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
10200 - Computer and information sciences
Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Conference Proceedings - IEEE SOUTHEASTCON
ISBN
9781665476119
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
654-658
Publisher name
IEEE
Place of publication
NEW YORK
Event location
Orlando
Event date
Apr 14, 2023
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000996154700100