Cleaning of tungsten tips for subsequent cold field emission application.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F23%3APU149503" target="_blank" >RIV/00216305:26220/23:PU149503 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Cleaning of tungsten tips for subsequent cold field emission application.
Original language description
An important aspect of many applications involves the cleaning of crucial components, which can vary depending on their subsequent use (e.g., vacuum level, ongoing chemical reactions, sample sensitivity, etc.). In this study, we will address the cleaning of cold field emission electron emitters, where a clean surface is required for subsequent layer deposition and to classify the nature of the resulting interface.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů